Measuring instruments of parameters of semiconductor devices IPPP-3, IPPP-3/1

• Measurement of parameters of semiconductor devices (including on a wafer), defect analysis
• Limitation of current and voltage at the electrodes of the test object according to predefined thresholds in channels C, B, S
• Display of measured and calculated characteristics in the form of graphs and tables
• Saving tables electronically
• Formation of a report on the results of measurement, calculation and permissible control of parameters with an indication of suitability
• The presence of a library of standard tests for measuring the parameters of standard semiconductor devices
• Ability to create a library of user tests by setting parameters for measurement conditions
• The ability to create your own measurement models according to the principle: product, test item, test
• Creating your own archive of reference graphs with the ability to impose a reference I – V characteristic on a measured characteristic
• Marker measurements, tangent plotting
• Inverted polarity of the X and Y axes
• Loop Compensation, Screen Magnifier Mode

Specifications

• Channel C (collector, drain)

Voltage Source (Uc):

Current Meter (Ic):

- ranges from ± 10 nA to ± 20 A (± 50 A IPPP-3/1), according to series 1, 2, 5, 10;

- minimum sampling - 0.005 nA;

- measurement error:

                   ± [(1.0¸1.5)% of I + 0.5% of I], with Ic ≤ 2A;

                   ± [9% of Ii + 1% of Ip], at Ic> 2A.

Voltage Meter (Uc):

- ranges from ± 0.5 V to ± 2000 V, according to series 1, 2, 5, 10;

- minimum discretion - 0.2 mV;

- measurement error: ± (1% of Uи + 0.5% of Uп),

where Uп (Iп) is the upper limit of the voltage (current) range;

Uи (Iи) - voltage (current), measured at the load;

Uf (If) - formed voltage (current).

•  Channel B (base, gate)

Type of output signal current (voltage):

- stepwise variable signal with offset;

- impulse steps with impulse bias;

- constant level.

Current (voltage) stage generator:

- number of steps - from 0 to 10; 
- current steps (Istep) from 2 nA / stup to 0.5 A / stup;
- voltage steps (Ustep) from 50 mV / stup to 2 V / stup, according to a number 1, 2, 5, 10;
- tenfold reduction of a step (x0.1);
- bias current (voltage) range - ± 10 · Istep (± 10 · Ustep);
- maximum constant output current Iout - ± 2.5 A, with Uout ≤ 4V;
- maximum output voltage - ± 40 V, at Iout £ 0.1 A;
- output resistance of at least 1010 Ohms, with Istep = 2 nA / stup.

Current Meter (Ib):

-ranges from ± 40 nA to ± 10 A, according to series 1, 2, 4, 10;

- minimum discretion - 0.02 nA;

- error in the formation (measurement) of current -

± [(1.0¸1.5)% of Iph (Ii) + 0.5% of Ip], at Ib £ 2.5 A.

Voltage Meter (Ub):

- ranges from ± 1 V to ± 40 V, according to series 1, 2, 4, 10;

- minimum discretion - 0.5 mV;

- the error in the formation (measurement) of voltage -

± (1% of Uf (Ui) + 0.5% of Uп).

• Channel E (emitter, source) - zero potential (common).

• Channel S (substrate)

Maximum output current (Iout) - ± 10mA, with Uout £ 40V;

For other parameters see “Channel B”.

Contents of delivery:

IPPP-3 or IPPP-3/1 measuring instrument.

The portable device for installation of the test object, equipped with a transparent cover and a removable metal screen.

Two-wire connector for connecting two- and three-terminal devices, two-wire contact clamps (3 pcs.), Single-wire probe clamps (4 pcs.) For connecting to the electrodes of the test object.

Cable connector for connecting to probes (two-wire connection).

General characteristics:

12.1 "LCD screen with a resolution of 1024 x 768, keyboard, mouse.

USB, Ethernet.

Supply voltage: 230 V / 50 Hz., Power: 450 V · And.

Operating temperature range: from + 5 ° to + 40 ° С.

Dimensions (W x H x D): 470 x 330 x 570 mm, weight: 37 kg